SENDIRA 中红外光谱椭偏仪
名称：涂镀层测厚仪
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简介：SENDIRA 中红外光谱椭偏仪 厂商名称： SENTHCH 商品名称： 中红外光谱椭偏仪 商品型号： SENDIRA 简单信息： 中红外光谱椭偏仪具有大面积水平样品台，马达驱动可变入射角度，支持样品水平扫描，吹氮气去水蒸气保护红外光学透镜...
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SENDIRA 中红外光谱椭偏仪
厂商名称： SENTHCH
商品名称： 中红外光谱椭偏仪
商品型号： SENDIRA
简单信息： 中红外光谱椭偏仪具有大面积水平样品台，马达驱动可变入射角度，支持样品水平扫描，吹氮气去水蒸气保护红外光学透镜。提供新材料如有机物半导体, OLED和有机物光谱范围内振动光谱的优良结果。提供复杂多层膜上化学、机械、电气、光学信息。即可作为研发工具.
SE 900-50 红外光谱椭偏仪替代型号
Basics The ellipsometer measures in reflection mode the optical response of a sample using polarized light.
The sample properties change the polarization state of the reflected light. Amplitude ratio and phase difference of the Fresnel reflection coefficients rpand rsare used to investigate material composition, molecule orientation, film thickness and optical constants of single films and layer stacks.
Benefits of SENDIRA IR spectroscopic ellipsometer
Measures two parameters: amplitude ratio and phase differences
Sensitive to mono layers and molecule orientation
Easy sample preparation, no reference sample required
Combines SE with R and T measurements
Large sample analysis, mapping capabilities
Key features
•Wavelength range: 400 cm-1–6000 cm-1
•Separate ellipsometer optics, ellipsometer uses external port of FT-IR instrument
•Complete accessible FT-IR spectrometer
•Large samples, maximal sample size 200 mm diameter, maximal sample height 8 mm
•Ellipsometric, transmission and reflection measurements with polarized light
•Variable incident angle of light (VASE)
•SENTECH comprehensive software for spectroscopic ellipsometry SpectraRay
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